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Optimization for SEU/SET Immunity on 0.15 μm Fully Depleted CMOS/SOI Digital Logic Devices
https://jaxa.repo.nii.ac.jp/records/21495
https://jaxa.repo.nii.ac.jp/records/21495cd4c4302-2c15-49a4-8ce1-5ae9e64d3b6f
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Optimization for SEU/SET Immunity on 0.15 μm Fully Depleted CMOS/SOI Digital Logic Devices | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Makihara, A
× Makihara, A× Yamaguchi, T× Asai, H× Tsuchiya, Y× Amano, Y× Midorikawa, M× Shindou, H× Onoda, S× Hirao, T× Nakajima, Y× Takahashi, Y× Ohnishi, K× Kuboyama, S |
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著者所属(英) | ||||||
en | ||||||
High-Reliability Components Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
High-Reliability Components Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
High-Reliability Components Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
High-Reliability Components Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
High-Reliability Components Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency(JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency(JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency(JAEA),Takasaki Radiation Chemistry Research Establishment | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency(JAEA),Takasaki Radiation Chemistry Research Establishment | ||||||
著者所属(英) | ||||||
en | ||||||
Nihon University | ||||||
著者所属(英) | ||||||
en | ||||||
Nihon University | ||||||
著者所属(英) | ||||||
en | ||||||
Nihon University | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency(JAXA) | ||||||
出版者(英) | ||||||
出版者 | The Institute of Electrical and Electronics Engineers, Inc., NUCLEAR&PLASMA SCIENCES SOCIETY(IEEE)(NPSS) | |||||
書誌情報 |
en : IEEE Transactions on Nuclear Science 巻 53, 号 6, p. 3422-3427, 発行日 2006-12 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9499 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TNS.2006.885166 | |||||
関連名称 | info:doi/10.1109/TNS.2006.885166 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: ARDS06117000 |