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Experimental verification of scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems
https://jaxa.repo.nii.ac.jp/records/24117
https://jaxa.repo.nii.ac.jp/records/241179e80776d-3324-43da-92a7-9881d8ce1237
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Experimental verification of scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
柳川, 善光
× 柳川, 善光× 小林, 大輔× 廣瀬, 和之× 牧野, 高紘× 齋藤, 宏文× 池田, 博一× 小野田, 忍× 平尾, 敏雄× 大島, 武× Yanagawa, Y.× Kobayashi, Daisuke× Hirose, Kazuyuki× Makino, T.× Saito, Hirobumi× Ikeda, Hirokazu× Onoda, S.× Hirao, T.× Ohshima, T. |
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著者所属 | ||||||
東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 総合研究大学院大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 総合研究大学院大学 | ||||||
著者所属 | ||||||
総合研究大学院大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 東京大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構宇宙科学研究本部(JAXA) (ISAS) : 総合研究大学院大学 | ||||||
著者所属 | ||||||
日本原子力研究開発機構 | ||||||
著者所属 | ||||||
日本原子力研究開発機構 | ||||||
著者所属 | ||||||
日本原子力研究開発機構 | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Electronic Engineering, School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate University for Advanced Studies | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate University for Advanced Studies | ||||||
著者所属(英) | ||||||
en | ||||||
Graduate University for Advanced Studies | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Department of Electronics Engineering, School of Engineering, The University of Tokyo | ||||||
著者所属(英) | ||||||
en | ||||||
Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate University for Advanced Studies | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers | |||||
出版者(英) | ||||||
出版者 | Inc. | |||||
書誌情報 |
en : IEEE Transactions on Nuclear Science 巻 56, 号 4, p. 1958-1963, 発行日 2009-08 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9499 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667999 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TNS.2009.2020166 | |||||
関連名称 | info:doi/10.1109/TNS.2009.2020166 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1000801000 |