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Impact of the Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions
https://jaxa.repo.nii.ac.jp/records/26542
https://jaxa.repo.nii.ac.jp/records/26542c543e8d0-7dff-4563-bf81-af37f76aaa94
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Impact of the Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Rodriguez, Abraham Luque
× Rodriguez, Abraham Luque× Gonzalez, Mireia Bargallo× Eneman, Geert× Claeys, Cor× 小林, 大輔× Simoen, Eddy× Tejada, Juan A. Jimenez× Rodriguez, Abraham Luque× Gonzalez, Mireia Bargallo× Eneman, Geert× Claeys, Cor× Kobayashi, Daisuke× Simoen, Eddy× Tejada, Juan A. Jimenez |
|||||
著者所属 | ||||||
Interuniversity Microelectronics Center | ||||||
著者所属 | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属 | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven : Fonds Wetenschappelijk Onderzoek-Vlaanderen | ||||||
著者所属 | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属 | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属 | ||||||
Interuniversity Microelectronics Center | ||||||
著者所属 | ||||||
Departamento de Electronica y Tecnologia de los Computadores, Facultad de Ciencias, Universidad de Granada | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven : Fonds Wetenschappelijk Onderzoek-Vlaanderen | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center : Department of Electrical Engineering (ESAT)-Integrated System, Katholieke Universiteit Leuven | ||||||
著者所属(英) | ||||||
en | ||||||
Interuniversity Microelectronics Center | ||||||
著者所属(英) | ||||||
en | ||||||
Departamento de Electronica y Tecnologia de los Computadores, Facultad de Ciencias, Universidad de Granada | ||||||
出版者(英) | ||||||
出版者 | Institute of Electrical and Electronics Engineers | |||||
書誌情報 |
en : IEEE Transactions on Electron Devices 巻 58, 号 8, p. 2362-2370, 発行日 2011-08 |
|||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2011-04-19 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9383 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667820 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TED.2011.2148723 | |||||
関連名称 | info:doi/10.1109/TED.2011.2148723 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1003244000 |