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MDS-1(つばさ)搭載民生用メモリ素子のトータルドーズ効果に関する解析結果
https://jaxa.repo.nii.ac.jp/records/2766
https://jaxa.repo.nii.ac.jp/records/27668018e567-f4e5-4864-a2e8-a7669cd7a2b9
名前 / ファイル | ライセンス | アクション |
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46975006.pdf (1.3 MB)
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Item type | テクニカルレポート / Technical Report(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
タイトル | MDS-1(つばさ)搭載民生用メモリ素子のトータルドーズ効果に関する解析結果 | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 航空宇宙環境 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 宇宙機設計 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 宇宙線 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 放射線損傷 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 民生用半導体部品実験装置 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | つばさ | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 総照射線量 | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | aerospace environment | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | spacecraft design | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | cosmic ray | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | radiation damage | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | commercial semiconductor device | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Tsubasa | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | total ionizing dose | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_18gh | |||||
資源タイプ | technical report | |||||
その他のタイトル(英) | ||||||
その他のタイトル | Analysis results of total ionization dose effects on COTS memories by MDS-1 | |||||
著者 |
新藤, 浩之
× 新藤, 浩之× 池田, 直美× 飯出, 芳弥× 浅井, 弘彰× 久保山, 智司× 松田, 純夫× Shindo, Hiroyuki× Ikeda, Naomi× Iide, Yoshiya× Asai, Hiroaki× Kuboyama, Satoshi× Matsuda, Sumio |
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著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構 | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構研究開発資料: 民生部品・コンポーネント実証衛星つばさ:MDS-1軌道上実証成果報告書 en : JAXA Research and Development Memorandum: Report of Flight Demonstration Results of the Mission Demonstration Test Satellite-1 (MDS-1; TSUBASA) 巻 JAXA-RM-03-022, p. 522-525, 発行日 2004-02-04 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | This paper shows the analysis results of the Total Ionizing Dose (TID) Effects on COTS Memories by MDS-1 (Tsubasa) satellite. Seven types of commercial devices are installed and evaluated. The measurement result basically consists with the prediction from the ground test data in all devices. But, in DRAMs, the change of the electrical characteristic caused by TID effect surpasses the prediction. This result indicates that the criteria of the ground TID evaluation test should be carefully determined. These results will be reflected in the establishment of guideline for the ground test technique. | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-1121 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11983593 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0046975006 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-RM-03-022 |