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Quantitative analysis of helium by post-ionization method using femtosecond laser technique
https://jaxa.repo.nii.ac.jp/records/29197
https://jaxa.repo.nii.ac.jp/records/29197bdd96bff-2dac-4013-b1a9-0207562ca2d5
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2017-01-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Quantitative analysis of helium by post-ionization method using femtosecond laser technique | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | tunnel-ionization | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | helium | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | post-ionization | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | femtosecond laser | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | mass spectrometry | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | quantitative analysis | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
圦本, 尚義
× 圦本, 尚義× 馬上, 謙一× 坂口, 勲× Suzuki, Taku T.× Jurewicz, Amy J. G.× 糸瀬, 悟× 内野, 喜一郎× 石原, 盛男× Yurimoto, Hisayoshi× Bajo, Ken-ichi× Sakaguchi, Isao× Suzuki, Taku T.× Jurewicz, Amy J. G.× Itose, Satoru× Uchino, Kiichiro× Ishihara, Morio |
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著者所属 | ||||||
北海道大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) | ||||||
著者所属 | ||||||
北海道大学 | ||||||
著者所属 | ||||||
物質・材料研究機構 | ||||||
著者所属 | ||||||
物質・材料研究機構 | ||||||
著者所属 | ||||||
CMS/SESE, Arizona State University | ||||||
著者所属 | ||||||
日本電子株式会社 | ||||||
著者所属 | ||||||
九州大学 | ||||||
著者所属 | ||||||
大阪大学 | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Natural History Sciences, Hokkaido University : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Natural History Sciences, Hokkaido University | ||||||
著者所属(英) | ||||||
en | ||||||
National Institute for Materials Science | ||||||
著者所属(英) | ||||||
en | ||||||
National Institute for Materials Science | ||||||
著者所属(英) | ||||||
en | ||||||
CMS/SESE, Arizona State University | ||||||
著者所属(英) | ||||||
en | ||||||
JEOL Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Graduate School of Engineering Sciences, Kyushu University | ||||||
著者所属(英) | ||||||
en | ||||||
Department of Physics, Osaka University | ||||||
出版者(英) | ||||||
出版者 | Heyden & Son | |||||
書誌情報 |
en : Surface and Interface Analysis 巻 48, 号 11, p. 1181-1184, 発行日 2016-11 |
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内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Accepted: 2016-07-19 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0142-2421 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00445749 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1002/sia.6119 | |||||
関連名称 | info:doi/10.1002/sia.6119 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: SA1160174000 |