Institute of Space and Aeronautical Science,University of Tokyo
雑誌名
ISAS report/Institute of Space and Aeronautical Science,University of Tokyo
巻
37
号
15
ページ
369 - 376
発行年
1972-12
抄録(英)
A new kind of X-ray polarimeter, which was successfully operated below 2KeV X-ray, is described. The angular distribution of secondary fluorescent X-rays emitted in the process of photoelectric effect is expected to exhibit an asymmetry correlated with the polarization vector of the initial X-ray. This asymmetrical behavior is utilized for polarization measurement.