This talk gives an overview of methods to test component failures caused by space radiation. First, a short introduction to the reasons such tests are necessary, and recent developments in test methodologies are given. Then, radiation environment and error effects, most specifically total dose and single-event-effects, are introduced. A more detailed description is given of the physics of different radiation interactions in semiconductors and the requirements they set for test methods. Facilities used worldwide to study radiation effects in electronics are listed, from which two commonly used test facilities are introduced in more detail.
内容記述
形態: カラー図版あり
内容記述（英）
Physical characteristics: Original contains color illustrations
Facilities and Radiation Test Methods
61889019.pdf
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