WEKO3
アイテム
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Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes
https://jaxa.repo.nii.ac.jp/records/4319
https://jaxa.repo.nii.ac.jp/records/4319c18d1bed-5062-4eaa-a646-7e56bde76dcc
名前 / ファイル | ライセンス | アクション |
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61889025.pdf (205.3 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | silicon-on-insulator (SOI) | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | soft error | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | floating body effect | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | body-tie structure | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | nuclear microprobe | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
Hazama, Masatoshi
× Hazama, Masatoshi× Abo, Satoshi× Masuda, Naoyuki× Wakaya, Fujio× Onoda, Shinobu× Makino, Takahiro× Hirao, Toshio× Oshima, Takeshi× Iwamatsu, Toshiaki× Oda, Hidekazu× Takai, Mikio× Hazama, Masatoshi× Abo, Satoshi× Masuda, Naoyuki× Wakaya, Fujio× Onoda, Shinobu× Makino, Takahiro× Hirao, Toshio× Oshima, Takeshi× Iwamatsu, Toshiaki× Oda, Hidekazu× Takai, Mikio |
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著者所属 | ||||||
大阪大学極限量子科学研究センター | ||||||
著者所属 | ||||||
大阪大学極限量子科学研究センター | ||||||
著者所属 | ||||||
大阪大学極限量子科学研究センター | ||||||
著者所属 | ||||||
大阪大学極限量子科学研究センター | ||||||
著者所属 | ||||||
日本原子力研究開発機構(JAEA) | ||||||
著者所属 | ||||||
日本原子力研究開発機構(JAEA) | ||||||
著者所属 | ||||||
日本原子力研究開発機構(JAEA) | ||||||
著者所属 | ||||||
日本原子力研究開発機構(JAEA) | ||||||
著者所属 | ||||||
ルネサス エレクトロニクス株式会社 | ||||||
著者所属 | ||||||
ルネサス エレクトロニクス株式会社 | ||||||
著者所属 | ||||||
大阪大学極限量子科学研究センター | ||||||
著者所属(英) | ||||||
en | ||||||
Center for Quantum Science and Technology under Extreme Conditions, Osaka University | ||||||
著者所属(英) | ||||||
en | ||||||
Center for Quantum Science and Technology under Extreme Conditions, Osaka University | ||||||
著者所属(英) | ||||||
en | ||||||
Center for Quantum Science and Technology under Extreme Conditions, Osaka University | ||||||
著者所属(英) | ||||||
en | ||||||
Center for Quantum Science and Technology under Extreme Conditions, Osaka University | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency (JAEA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency (JAEA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency (JAEA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Atomic Energy Agency (JAEA) | ||||||
著者所属(英) | ||||||
en | ||||||
Renesas Electronics Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
Renesas Electronics Corporation | ||||||
著者所属(英) | ||||||
en | ||||||
Center for Quantum Science and Technology under Extreme Conditions, Osaka University | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構(JAXA) | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication 巻 JAXA-SP-12-008E, p. 119-122, 発行日 2013-03-29 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Soft error rates (SERs) in partially depleted (PD) silicon-on-insulator (SOI) static random access memories (SRAMs) with a technology node of 90 nm have been investigated by hydrogen, helium, lithium, beryllium, carbon and oxygen ions, accelerated up to a few tens of MeV using a tandem accelerator. The SERs increased with increasing the amount of the generated charge in the SOI body by a floating body effect, even if the amount of the generated charge was less than the critical charge. The SERs with the generated charge in the SOI body more than the critical charge were almost constant. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: 図版あり | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 著者人数: 11名 | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains illustrations | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Number of authors: 11 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0061889025 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-12-008E |