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電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について
https://jaxa.repo.nii.ac.jp/records/4697
https://jaxa.repo.nii.ac.jp/records/4697d9fa4b70-9d54-4819-b68a-f03687e96f26
名前 / ファイル | ライセンス | アクション |
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64933019.pdf (8.1 MB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
タイトル | 電荷蓄積法による誘電体体積抵抗率におけるパラメータ依存性について | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Dielectrics | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Spacecraft Charglng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Vblume resistivity | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Charge storage method | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
その他のタイトル(英) | ||||||
その他のタイトル | Experimental Parameter Dependency on Dielectric Volume Resistivity in Charge storage method | |||||
著者 |
櫻井, 和也
× 櫻井, 和也× 渡邉, 力夫× 三宅, 弘晃× 仁田, 工美× Sakurai, Kazuya× Watanabe, Rikio× Miyake, Hiroaki× Nitta, Kumi |
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著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構 | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料: 第7回宇宙環境シンポジウム講演論文集 en : JAXA Special Publication: Proceedings of the 7th Spacecraft Enivironment Symposium 巻 JAXA-SP-10-013, 発行日 2011-02-28 |
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会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 第7回宇宙環境シンポジウム (2010年10月19日-20日. 東京国際フォーラム) | |||||
会議概要(会議名, 開催地, 会期, 主催者等)(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 7th Spacecraft Enivironment Symposium (October 19-20, 2010, Tokyo International Forum), Tokyo Japan | |||||
抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | For determination of dielectric volume resistivty under space environment, it is important to understand the effect of test pammeters such as electron energy and sample temperature. In this paper, the effect of sample thickness, electron irradiation energy and temperature on volume resistivity is analyzed by the charge storage method. The dielectric material considered here is typical polyimide(Kapton) film. The experimental results indicate that higher electron energy and thinner sample thickness show lower resistivity. Higher temperatur also exhibits lower ressistivity according to the Boltzmann type resistivity decrease. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0064933019 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-10-013 |