WEKO3
アイテム
{"_buckets": {"deposit": "0accea04-3577-4e30-9618-39b73433c0a0"}, "_deposit": {"created_by": 1, "id": "6328", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "6328"}, "status": "published"}, "_oai": {"id": "oai:jaxa.repo.nii.ac.jp:00006328", "sets": ["1066", "1891"]}, "author_link": ["31971", "31985", "31974", "31978", "31973", "31981", "31982", "31984", "31970", "31977", "31976", "31979", "31972", "31980", "31983", "31975"], "item_5_biblio_info_10": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2005-08-01", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "110", "bibliographicPageStart": "104", "bibliographicVolumeNumber": "JAXA-SP-05-001E", "bibliographic_titles": [{"bibliographic_title": "宇宙航空研究開発機構特別資料"}, {"bibliographic_title": "JAXA Special Publication: 9th Spacecraft Charging Technology Conference", "bibliographic_titleLang": "en"}]}]}, "item_5_description_17": {"attribute_name": "抄録(英)", "attribute_value_mlt": [{"subitem_description": "Spacecraft are exposed to a harsh environment where high-energy charged particles, such as electrons and protons, are scattering. When a large amount of the charged particles is irradiated onto insulating materials of the spacecraft, an electrostatic discharge may occur. The electrostatic discharge sometimes gives a serious damage to the systems of the spacecraft. To investigate the process how the charged particles accumulate into the bulk of the insulating materials, we have developed the internal charge measurement system using optical method. We have already confirmed using Pulsed Electro-Acoustic method (PEA method) that the irradiated electrons accumulate in the bulk of an acrylic resin when the electron beam is irradiated to it. However the PEA method is available under only a restricted measurement condition. Therefore, we have attempted to develop a widely usable measurement system using optical method. In this report, to estimate the reliability of the optical measurement system, we compare the distribution of the accumulated charge observed using the optical method with that obtained using PEA method.", "subitem_description_type": "Other"}]}, "item_5_description_32": {"attribute_name": "資料番号", "attribute_value_mlt": [{"subitem_description": "資料番号: AA0049206013", "subitem_description_type": "Other"}]}, "item_5_description_33": {"attribute_name": "レポート番号", "attribute_value_mlt": [{"subitem_description": "レポート番号: JAXA-SP-05-001E", "subitem_description_type": "Other"}]}, "item_5_publisher_8": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "宇宙航空研究開発機構"}]}, "item_5_publisher_9": {"attribute_name": "出版者(英)", "attribute_value_mlt": [{"subitem_publisher": "Japan Aerospace Exploration Agency (JAXA)"}]}, "item_5_source_id_21": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1349-113X", "subitem_source_identifier_type": "ISSN"}]}, "item_5_source_id_24": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA11984031", "subitem_source_identifier_type": "NCID"}]}, "item_5_text_20": {"attribute_name": "その他キーワード", "attribute_value_mlt": [{"subitem_text_value": "光学"}, {"subitem_text_value": "計装(計測制御装置の装備技術)及び写真技術"}, {"subitem_text_value": "宇宙船設計、試験及び性能"}]}, "item_5_text_35": {"attribute_name": "JAXAカテゴリ", "attribute_value_mlt": [{"subitem_text_value": "JAXAカテゴリ: 特別資料"}]}, "item_5_text_40": {"attribute_name": "jaxa出版物種類", "attribute_value_mlt": [{"subitem_text_value": "jaxa出版物種類: SP"}]}, "item_5_text_43": {"attribute_name": "DSpaceコレクション番号", "attribute_value_mlt": [{"subitem_text_value": "DSpaceコレクション番号: 7"}]}, "item_5_text_6": {"attribute_name": "著者所属", "attribute_value_mlt": [{"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "武蔵工業大学"}, {"subitem_text_value": "ABB Co. Ltd."}]}, "item_5_text_7": {"attribute_name": "著者所属(英)", "attribute_value_mlt": [{"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "Musashi Institute of Technology"}, {"subitem_text_language": "en", "subitem_text_value": "ABB Co. Ltd."}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "三觜, 健太"}], "nameIdentifiers": [{"nameIdentifier": "31970", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "臼井, 悠輔"}], "nameIdentifiers": [{"nameIdentifier": "31971", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "吉田, 憲平"}], "nameIdentifiers": [{"nameIdentifier": "31972", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "田中, 康寛"}], "nameIdentifiers": [{"nameIdentifier": "31973", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "高田, 達雄"}], "nameIdentifiers": [{"nameIdentifier": "31974", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "渡辺, 力夫"}], "nameIdentifiers": [{"nameIdentifier": "31975", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "冨田, 信之"}], "nameIdentifiers": [{"nameIdentifier": "31976", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Liu, Rongsheng"}], "nameIdentifiers": [{"nameIdentifier": "31977", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Mitsuhashi, Kenta", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31978", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Usui, Yusuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31979", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yoshida, Kenpei", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31980", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanaka, Yasuhiro", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31981", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takada, Tatsuo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31982", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Watanabe, Rikio", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31983", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tomita, Nobuyuki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31984", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Liu, Rongsheng", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "31985", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2020-01-16"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "49206013.pdf", "filesize": [{"value": "1.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1400000.0, "url": {"label": "49206013.pdf", "url": "https://jaxa.repo.nii.ac.jp/record/6328/files/49206013.pdf"}, "version_id": "87805af7-a08a-4f7d-bfd0-27aa7fc4e10f"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "宇宙機帯電", "subitem_subject_scheme": "Other"}, {"subitem_subject": "電荷分布", "subitem_subject_scheme": "Other"}, {"subitem_subject": "光学測定装置", "subitem_subject_scheme": "Other"}, {"subitem_subject": "光学測定", "subitem_subject_scheme": "Other"}, {"subitem_subject": "荷電粒子", "subitem_subject_scheme": "Other"}, {"subitem_subject": "高エネルギー電子", "subitem_subject_scheme": "Other"}, {"subitem_subject": "航空宇宙環境", "subitem_subject_scheme": "Other"}, {"subitem_subject": "静電放電", "subitem_subject_scheme": "Other"}, {"subitem_subject": "電気音響法", "subitem_subject_scheme": "Other"}, {"subitem_subject": "ポリメチルメタクリレート", "subitem_subject_scheme": "Other"}, {"subitem_subject": "絶縁", "subitem_subject_scheme": "Other"}, {"subitem_subject": "spacecraft charging", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "charge distribution", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "optical measuring instrument", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "optical measurement", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "charged particle", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "high energy electron", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "aerospace environment", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "electrostatic discharge", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "electroacoustic method", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "polymethyl methacrylate", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}, {"subitem_subject": "electrical insulation", "subitem_subject_language": "en", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "Development of optical measurement system for internal charge distribution in insulating materials", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Development of optical measurement system for internal charge distribution in insulating materials", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["1066", "1891"], "permalink_uri": "https://jaxa.repo.nii.ac.jp/records/6328", "pubdate": {"attribute_name": "公開日", "attribute_value": "2015-03-26"}, "publish_date": "2015-03-26", "publish_status": "0", "recid": "6328", "relation": {}, "relation_version_is_last": true, "title": ["Development of optical measurement system for internal charge distribution in insulating materials"], "weko_shared_id": -1}
Development of optical measurement system for internal charge distribution in insulating materials
https://jaxa.repo.nii.ac.jp/records/6328
https://jaxa.repo.nii.ac.jp/records/6328297583a7-e391-46e3-98c5-e2a70812be5a
名前 / ファイル | ライセンス | アクション |
---|---|---|
49206013.pdf (1.4 MB)
|
|
Item type | 会議発表論文 / Conference Paper(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Development of optical measurement system for internal charge distribution in insulating materials | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 宇宙機帯電 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 電荷分布 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 光学測定装置 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 光学測定 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 荷電粒子 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 高エネルギー電子 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 航空宇宙環境 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 静電放電 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 電気音響法 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | ポリメチルメタクリレート | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 絶縁 | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | spacecraft charging | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | charge distribution | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | optical measuring instrument | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | optical measurement | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | charged particle | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | high energy electron | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | aerospace environment | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | electrostatic discharge | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | electroacoustic method | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | polymethyl methacrylate | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | electrical insulation | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
三觜, 健太
× 三觜, 健太× 臼井, 悠輔× 吉田, 憲平× 田中, 康寛× 高田, 達雄× 渡辺, 力夫× 冨田, 信之× Liu, Rongsheng× Mitsuhashi, Kenta× Usui, Yusuke× Yoshida, Kenpei× Tanaka, Yasuhiro× Takada, Tatsuo× Watanabe, Rikio× Tomita, Nobuyuki× Liu, Rongsheng |
|||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
武蔵工業大学 | ||||||
著者所属 | ||||||
ABB Co. Ltd. | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
Musashi Institute of Technology | ||||||
著者所属(英) | ||||||
en | ||||||
ABB Co. Ltd. | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構 | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication: 9th Spacecraft Charging Technology Conference 巻 JAXA-SP-05-001E, p. 104-110, 発行日 2005-08-01 |
|||||
抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Spacecraft are exposed to a harsh environment where high-energy charged particles, such as electrons and protons, are scattering. When a large amount of the charged particles is irradiated onto insulating materials of the spacecraft, an electrostatic discharge may occur. The electrostatic discharge sometimes gives a serious damage to the systems of the spacecraft. To investigate the process how the charged particles accumulate into the bulk of the insulating materials, we have developed the internal charge measurement system using optical method. We have already confirmed using Pulsed Electro-Acoustic method (PEA method) that the irradiated electrons accumulate in the bulk of an acrylic resin when the electron beam is irradiated to it. However the PEA method is available under only a restricted measurement condition. Therefore, we have attempted to develop a widely usable measurement system using optical method. In this report, to estimate the reliability of the optical measurement system, we compare the distribution of the accumulated charge observed using the optical method with that obtained using PEA method. | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0049206013 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-05-001E |