@article{weko_21540_1,
   author	 = "久保山,智司 and 丸,明史 and 池田,直美 and 平尾,敏雄 and 田村,高志",
   title	 = "Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs",
   journal	 = "IEEE Transactions on Nuclear Science",
   year 	 = "2010",
   volume	 = "57",
   number	 = "6",
   pages	 = "3257--3261",
   month	 = "dec"
}