@article{weko_29343_1,
   author	 = "Lourenco,Nelson E. and Fleetwood,Zachary E. and Ildefonso,Adrian and Wachter,Mason T. and Roche,Nicolas J.-H. and Khachatrian,Ani and McMorrow,Dale and Buchner,Stephen P. and Warner,Jeffrey H. and 井辻,宏章 and 小林,大輔 and 廣瀬,和之 and Paki,Pauline and Raman,Ashok and Cressler,John D.",
   title	 = "The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs",
   journal	 = "IEEE Transactions on Nuclear Science",
   year 	 = "2017",
   volume	 = "64",
   number	 = "1",
   pages	 = "406--414",
   month	 = "jan"
}