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Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology
https://jaxa.repo.nii.ac.jp/records/4321
https://jaxa.repo.nii.ac.jp/records/432107648654-66a6-4d7e-bd7b-af3e65c81cb5
名前 / ファイル | ライセンス | アクション |
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61889027.pdf (715.8 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Investigation of the SEE sensitivity of 90nm DICE based Flip-Flops using pulsed laser testing methodology | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | 90nm, DICE | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Single event transient | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Charge sharing | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Pulsed-laser testing | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
Shindo, H.
× Shindo, H.× Maru, A.× Ebihara, T.× Makihara, A.× Kuboyama, S.× Tamura, T.× Shindo, H.× Maru, A.× Ebihara, T.× Makihara, A.× Kuboyama, S.× Tamura, T. |
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著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
HIREC株式会社 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属 | ||||||
宇宙航空研究開発機構(JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
High-Reliability Engineering & Components Corporation (HIREC) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構(JAXA) | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料 en : JAXA Special Publication 巻 JAXA-SP-12-008E, p. 127-130, 発行日 2013-03-29 |
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抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | This paper describes the evaluation result of the SEE sensitivity of 90nm DICE based flip-flops. Considering our past experimental results, modified DICE circuits were designed in order to minimize the charge sharing effect. The pulsed-laser SEE testing methodology was effectively utilized to identify the location of SEE sensitive areas. The comparison with the heavy ion irradiation test result were also discussed. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0061889027 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-12-008E |