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誘電体体積抵抗率計測時の温度可変システムについて
https://jaxa.repo.nii.ac.jp/records/5142
https://jaxa.repo.nii.ac.jp/records/51425983a36f-99e5-490a-956e-0360b670984b
名前 / ファイル | ライセンス | アクション |
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64542025.pdf (690.8 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2015-03-26 | |||||
タイトル | ||||||
タイトル | 誘電体体積抵抗率計測時の温度可変システムについて | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Dielectrics, Volume resistivity, Charge storage method | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
その他のタイトル(英) | ||||||
その他のタイトル | Temperature control for volume resistivity measurement | |||||
著者 |
櫻井, 和也
× 櫻井, 和也× 江面, 裕貴× 森岡, 祐貴× 渡邉, 力夫× 目黒, 在× 三宅, 弘晃× 仁田, 工美× Sakurai, Kazuya× Ezura, Yuki× Morioka, Yuki× Watanabe, Rikio× Meguro, Akira× Miyake, Hiroaki× Nitta, Kumi |
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著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
東京都市大学 | ||||||
著者所属 | ||||||
宇宙航空研究開発機構 | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Tokyo City University | ||||||
著者所属(英) | ||||||
en | ||||||
Japan Aerospace Exploration Agency (JAXA) | ||||||
出版者 | ||||||
出版者 | 宇宙航空研究開発機構 | |||||
出版者(英) | ||||||
出版者 | Japan Aerospace Exploration Agency (JAXA) | |||||
書誌情報 |
宇宙航空研究開発機構特別資料: 第6回「宇宙環境シンポジウム」講演論文集 en : JAXA Special Publication: Proceedings of the 6th Spacecraft Enivironment Symposium 巻 JAXA-SP-09-006, 発行日 2010-02-26 |
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会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 第6回宇宙環境シンポジウム (2009年2月29日-30日. 北九州国際会議場) | |||||
会議概要(会議名, 開催地, 会期, 主催者等)(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 6th Spacecraft Enivironment Symposium (February 29-30, 2009. Kitakyushu International Conference Center) | |||||
抄録(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | A sample temperature control system using Peltier device is developed for volume resistivity measurement of dielectrics. Four Peltier devices are installed under a dielectric film to keep sample temperature from - 40 deg. to + 80 deg. As a result of heat conduction test under vacuum, we found that the temperature is controlled within 1 deg when the temperature setting is 80 deg, but in the case of negative temperature setting, the temperature does not decrease because heat dissipation is not adequate. We measured volume resistivity of polyimide film by a charge storage method with temperature variation. The results indicate that volume resistivity in dark current region decreases as the sample temperature increases as theoretically estimated. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 形態: カラー図版あり | |||||
内容記述(英) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Physical characteristics: Original contains color illustrations | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1349-113X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11984031 | |||||
資料番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 資料番号: AA0064542025 | |||||
レポート番号 | ||||||
内容記述タイプ | Other | |||||
内容記述 | レポート番号: JAXA-SP-09-006 |