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Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits Dodd, P. E.. Schwank, J. R. Shaneyfelt, M. R. Felix, J. A. Paillet, P. Ferlet-Cavrois, V. Baggio, J. Reed, R. A. Warren, K. M. Weller, R. A. Schrimpf, R. D. Hash, G. L. Dalton, S. M. 廣瀬, 和之 齋藤, 宏文 Dodd, P. E.. Schwank, J. R. Shaneyfelt, M. R. Felix, J. A. Paillet, P. Ferlet-Cavrois, V. Baggio, J. Reed, R. A. Warren, K. M. Weller, R. A. Schrimpf, R. D. Hash, G. L. Dalton, S. M. Hirose, Kazuyuki Saito, Hirobumi 著者人数：15名 資料番号: SA1000140000 journal article IEEE Nuclear and Plasma Sciences Society 2007 IEEE Transactions on Nuclear Science 6 54 2303 2313 0018-9499 AA00667999 https://jaxa.repo.nii.ac.jp/records/23482 eng info:doi/10.1109/TNS.2007.909844 http://dx.doi.org/10.1109/TNS.2007.909844 metadata only access