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oai:jaxa.repo.nii.ac.jp:00029197 2023-06-21T01:38:22Z 1887:1888

Quantitative analysis of helium by post-ionization method using femtosecond laser technique 圦本, 尚義 馬上, 謙一 坂口, 勲 Suzuki, Taku T. Jurewicz, Amy J. G. 糸瀬, 悟 内野, 喜一郎 石原, 盛男 Yurimoto, Hisayoshi Bajo, Ken-ichi Sakaguchi, Isao Suzuki, Taku T. Jurewicz, Amy J. G. Itose, Satoru Uchino, Kiichiro Ishihara, Morio tunnel-ionization helium post-ionization femtosecond laser mass spectrometry quantitative analysis Accepted: 2016-07-19 資料番号: SA1160174000 journal article Heyden & Son 2016-11 Surface and Interface Analysis 11 48 1181 1184 0142-2421 AA00445749 https://jaxa.repo.nii.ac.jp/records/29197 eng info:doi/10.1002/sia.6119 http://dx.doi.org/10.1002/sia.6119 metadata only access