@inproceedings{oai:jaxa.repo.nii.ac.jp:00013653,
 author = {横田, 久美子 and 田川, 雅人 and 吉越, 章隆 and 寺岡, 有殿 and Yokota, Kumiko and Tagawa, Masahito and Yoshigoe, Akitaka and Teraoka, Yuden},
 book = {宇宙利用シンポジウム, Space Utilization Research: Proceedings of Space Utilization Symposium},
 month = {Mar},
 note = {第22回宇宙利用シンポジウム(2006年1月17日-19日, 日本学術会議6階会議室 六本木、東京), The Twenty-second Space Utilization Symposium (January 17-19, 2006: Science Council of Japan, Roppongi, Tokyo, Japan), The oxide film formed on Si(001) in a simulated low Earth orbit (LEO) space environment was analyzed by synchrotron radiation photoelectron spectroscopy (SR-PES). SR-PES results clearly indicated that the amount of suboxides at the Si/SiO2 interface formed in a simulated LEO environment at room temperature was much lower than that formed by an ordinary high-temperature oxidation process., 共催: 日本学術会議, Meeting sponsors: The Science Council of Japan, The Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (ISAS)(JAXA), 資料番号: AA0064113036},
 publisher = {宇宙航空研究開発機構宇宙科学研究本部, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)},
 title = {低地球軌道上の原子状酸素による酸化膜形成とその特徴(3)},
 volume = {22},
 year = {2006}
}