{"created":"2023-06-20T14:46:07.375341+00:00","id":13666,"links":{},"metadata":{"_buckets":{"deposit":"6250d6f4-ef5c-4a5a-91fd-8d1d1fce5bd5"},"_deposit":{"created_by":1,"id":"13666","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"13666"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00013666","sets":["1543:1633:1645","1887:1891"]},"author_link":["125064","125069","125068","125067","125066","125065"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Thermal Conductivity Measurement of Molten InSb by Hot-Disk Method under No Thermal Convection"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-03","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"22","bibliographic_titles":[{"bibliographic_title":"宇宙利用シンポジウム"},{"bibliographic_title":"Space Utilization Research: Proceedings of Space Utilization Symposium","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第22回宇宙利用シンポジウム(2006年1月17日-19日, 日本学術会議6階会議室 六本木、東京)","subitem_description_type":"Other"}]},"item_5_description_15":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）（英）","attribute_value_mlt":[{"subitem_description":"The Twenty-second Space Utilization Symposium (January 17-19, 2006: Science Council of Japan, Roppongi, Tokyo, Japan)","subitem_description_type":"Other"}]},"item_5_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Thermal conductivity of semiconductor melts, such as molten silicon and compound semiconductor, is an important thermophysical property in the control of crystal growth processes. Thermal conductivity can be measured via thermal response when heat or energy is applied to a specimen. However, it is difficult to measure the thermal conductivities of molten materials, due to the fact that the molten state has a high reactivity in the corrosion of the sensor and the container in coincident with heat and energy transfer via convection as well as conduction. To overcome these difficulties, a hot-disk sensor for molten metal, which consists of molybdenum foil as the sensor element and aluminum nitride (AlN) as the insulator, was developed and the thermal conductivities of molten silicon, tin and bismuth were previously measured in short-duration microgravity by hot-disk method with this developed hot-disk sensor. In this study, thermal conductivity of molten indium antimonide (InSb) was measured by hot-disk method in short-duration microgravity. Thermal conductivity of molten InSb measured in microgravity was 17.6 W/mK at 550C, which was 6% lower than that measured on the ground. The thermal conductivity at melting point (525C) was estimated to be 17.0 W/mK.","subitem_description_type":"Other"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"共催: 日本学術会議","subitem_description_type":"Other"}]},"item_5_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Meeting sponsors: The Science Council of Japan, The Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (ISAS)(JAXA)","subitem_description_type":"Other"}]},"item_5_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0064113049","subitem_description_type":"Other"}]},"item_5_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構宇宙科学研究本部"}]},"item_5_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)"}]},"item_5_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10324210","subitem_source_identifier_type":"NCID"}]},"item_5_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"産業技術総合研究所"},{"subitem_text_value":"産業技術総合研究所"},{"subitem_text_value":"産業技術総合研究所"}]},"item_5_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"National Institute of Advanced Industrial Science and Technology (AIST)"},{"subitem_text_language":"en","subitem_text_value":"National Institute of Advanced Industrial Science and Technology (AIST)"},{"subitem_text_language":"en","subitem_text_value":"National Institute of Advanced Industrial Science and Technology (AIST)"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"永井, 秀明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"間宮, 幹人"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"奥谷, 猛"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nagai, Hideaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mamiya, Mikito","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Okutani, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-20"}],"displaytype":"detail","filename":"64113049.pdf","filesize":[{"value":"200.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"64113049.pdf","url":"https://jaxa.repo.nii.ac.jp/record/13666/files/64113049.pdf"},"version_id":"78f826d0-7f88-430b-ab4c-7c6a13acfada"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Thermal conductivity, Molten InSb, Hot-Disk method, Thermal convection","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"ホットディスク法による無対流下でのInSb 融液の熱伝導度測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ホットディスク法による無対流下でのInSb 融液の熱伝導度測定"}]},"item_type_id":"5","owner":"1","path":["1645","1891"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"13666","relation_version_is_last":true,"title":["ホットディスク法による無対流下でのInSb 融液の熱伝導度測定"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T05:47:51.156422+00:00"}