@inproceedings{oai:jaxa.repo.nii.ac.jp:00013767,
 author = {横田, 久美子 and 田川, 雅人 and 吉越, 章隆 and 寺岡, 有殿 and Yokota, Kumiko and Tagawa, Masahito and Yoshigoe, Akitaka and Teraoka, Yuden},
 book = {宇宙利用シンポジウム　第21回　平成16年度, Space Utilization Research: Proceedings of the Twenty-first Space Utilization Symposium},
 month = {Mar},
 note = {The oxide film formed on Si(001) in a simulated Low Earth Orbit (LEO) space environment was analyzed by Synchrotron Radiation PhotoElectron Spectroscopy (SR-PES). SR-PES results clearly indicated that the amount of suboxides at the Si/SiO2 interface formed in a simulated LEO environment at room temperature was much lower than that formed by an ordinary high-temperature oxidation process., 資料番号: AA0048095038},
 pages = {166--167},
 publisher = {宇宙航空研究開発機構宇宙科学研究本部, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA/ISAS)},
 title = {低地球軌道上の原子状酸素による酸化膜形成とその特徴},
 year = {2005}
}