@inproceedings{oai:jaxa.repo.nii.ac.jp:00013861,
 author = {小池, 大輔 and 水野, 章敏 and 渡邉, 匡人 and Koike, Daisuke and Mizuno, Akitoshi and Watanabe, Masahito},
 book = {宇宙利用シンポジウム　第20回　平成15年度, Space Utilization Research: Proceedings of the Twentieth Space Utilization Symposium},
 month = {Mar},
 note = {Charged Si droplet of 1 to 10 micrometer diameter can be levitated by RF trap system, which make an AC electric field and a DC electric field at center of RF trap system. The electric charge of Si droplet at surface can be measured by comparing the Si droplet levitation pattern with the Si particle levitation pattern., 資料番号: AA0046917056},
 pages = {176--179},
 publisher = {宇宙航空研究開発機構宇宙科学研究本部, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA/ISAS)},
 title = {RFトラップ法における微小シリコン融液の浮遊パターン},
 year = {2004}
}