{"created":"2023-06-20T14:48:26.907664+00:00","id":16259,"links":{},"metadata":{"_buckets":{"deposit":"5fa5c40f-aaa2-42a6-b286-59d75381f2f4"},"_deposit":{"created_by":1,"id":"16259","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"16259"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00016259","sets":["1543:1693:1700","1887:1891"]},"author_link":["147507","147512","147514","147510","147511","147509","147516","147508","147513","147515"],"item_5_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"The Relation between Electric Field Distribution and Thrust Performance of Microwave Discharge Ion Engine Micro-10"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"6","bibliographicPageStart":"1","bibliographic_titles":[{"bibliographic_title":"平成24年度宇宙輸送シンポジウム: 講演集録"},{"bibliographic_title":"Proceedings of Space Transportation Symposium: FY2012","bibliographic_titleLang":"en"}]}]},"item_5_description_14":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"平成24年度宇宙輸送シンポジウム (2013年1月17日-1月18日. 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS)), 相模原市, 神奈川県","subitem_description_type":"Other"}]},"item_5_description_15":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）（英）","attribute_value_mlt":[{"subitem_description":"Space Transportation FY2012 (January 17-18, 2013. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS)), Sagamihara, Kanagawa Japan","subitem_description_type":"Other"}]},"item_5_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"マイクロ波放電式イオンスラスタの内部現象解明のためには、プラズマ生成に直結するスラスタ内部のマイクロ波電場測定が非常に重要である。本研究では電気光学素子ファイバプローブ（EOプローブ）をイオンスラスタの電場測定に適用することを提案した。EOプローブは金属を含まず微小なため、内部状態に擾乱を与えず非破壊で放電室に挿入することが可能である。本研究では（1）EOプローブを用いたビーム加速下のプラズマ中電場測定技術の確立と（2）未解明現象である高流量時の推力低下メカニズムおよび推進剤投入位置による性能変化メカニズムの解明を目標に研究を行った。電場測定結果は、FDTD解析結果と一致した。またプローブ挿入によるスラスタへの影響は8% 以下、加速プラズマ下でのプローブ感度変動は10% 以下であった。現象解明では中心軸上およびECR領域の電場分布を測定し考察を行った。その結果、導波管投入の際、高流量時に導波管内でマイクロ波の反射が起こり、電子加熱が行われるECR領域の電場強度が低下することがわかった。また推進剤を放電室より投入することは導波管内で反射が起きる流量をより高流量側へシフトさせる効果があり、その結果ECR領域での電場強度が最大になる流量がより高流量側へシフトし、推力増強につながったことがわかった。","subitem_description_type":"Abstract"}]},"item_5_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"形態: 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