@inproceedings{oai:jaxa.repo.nii.ac.jp:00016644,
 author = {村本, 哲也 and 百武, 徹 and 西田, 迪雄 and 剣持, 貴弘 and Muramoto, Tetsuya and Hyakutake, Toru and Nishida, Michio and Kenmotsu, Takahiro},
 book = {宇宙輸送シンポジウム: 講演集録, Proceedings of Space Transportation Symposium},
 month = {Jan},
 note = {平成21年度宇宙輸送シンポジウム(2010年1月14日-15日, 宇宙航空研究開発機構宇宙科学研究本部), Space Transportation Symposium (January 14-15, 2010. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)),  Sagamihara, Kanagawa Japan, The molecular dynamics(MD) simulation is performed to calculate reflection, trapping and sputtering rates by low-energy carbon particle impacts on carbon materials, where the incident energy range from 10eV to 50eV per carbon atom and the polar incident angle range from Odeg to 80deg are considered. As a result, it found that there are three characteristic incldent conditions for high frequency of reflection, shallow trapping and deep trapping on diamond(111) surface. However amorphous carbon hardly caused reflection, and the deposition rate mainly depends on the sputtering yield. One can use this result in order to estimate the redeposition of sputtered carbon particles on accelerator grids of an ion engine., 形態: カラー図版あり, 形態: CD-ROM1枚, Physical characteristics: Original contains color illustrations, Note: One CD-ROM, 資料番号: AA0064741074},
 publisher = {宇宙航空研究開発機構宇宙科学研究本部, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)},
 title = {低エネルギー炭素粒子再付着のMDシミュレーション},
 volume = {平成21年度},
 year = {2010}
}