@inproceedings{oai:jaxa.repo.nii.ac.jp:00020480,
 author = {荒井, 武彦 and 岡田, 達明 and 白井, 慶 and 山本, 幸生 and 小川, 和律 and 白石, 浩章 and 加藤, 學 and Arai, Takehiko and Okada, Tatsuaki and Shirai, Kei and Yamamoto, Yukio and Ogawa, Kazunori and Shiraishi, Hiroaki and Kato, Manabu},
 book = {第39回月・惑星シンポジウム, Proceedings of the 39th ISAS Lunar and Planetary Symposium},
 month = {Aug},
 note = {X-ray fluorescence spectrometers onboard SELENE (SELenological and ENgineering Explorer), XRS (X-Ray Spectrometer), will quantitatively and globally determine major elemental compositions of lunar surface such as Mg, Al, Si, Ca, Ti, and Fe in energy-range of 0.7 to 10.0 keV. The XRS mounts standard sample for comparative analysis. The observations will allow to construct maps of lunar elements and rock-types. It allows to study the lunar origin and evolution. In this study, we developed analysis methods with standard sample and introduce this method., 資料番号: AA0063505018},
 pages = {69--72},
 publisher = {宇宙航空研究開発機構宇宙科学研究本部, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA/ISAS)},
 title = {Development of X-ray fluorescence analysis method for X-ray spectrometers onboard SELENE},
 year = {2006}
}