@article{oai:jaxa.repo.nii.ac.jp:00021540,
 author = {久保山, 智司 and 丸, 明史 and 池田, 直美 and 平尾, 敏雄 and 田村, 高志 and Kuboyama, Satoshi and Maru, Akifumi and Ikeda, Naomi and Hirao, Toshio and Tamura, Takashi},
 issue = {6},
 journal = {IEEE Transactions on Nuclear Science},
 month = {Dec},
 note = {資料番号: ARDS91212000},
 pages = {3257--3261},
 title = {Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs},
 volume = {57},
 year = {2010}
}