@article{oai:jaxa.repo.nii.ac.jp:00021734,
 author = {山中, 理代 and 森, 一之 and 宮崎, 英治 and 山口, 孝夫 and 小田原, 修 and Yamanaka, Riyo and Mori, Kazuyuki and Miyazaki, Eiji and Yamaguchi, Takao and Odawara, Osamu},
 issue = {4},
 journal = {International Journal of Microgravity Science and Application (IJMSA)},
 month = {Oct},
 note = {In order to clarify the influences of atomic oxygen (AO) or the interaction between ultraviolet rays (UV) and AO to optical properties of silicone contaminants, UV-and AO-irradiated silicone contaminants were evaluated through optical property measurement. RTV-S691, a silicone adhesive with low volatiles content and minimum outgassing behavior for space utilizations, was used as an outgassing source, and two optical materials (magnesium fluoride and zinc selenide) were used for collecting contaminants from the RTV-S691. Optical properties were examined by Fourier transform infrared spectroscopy and Ultraviolet-visible-near infrared spectroscopy. RTV-S691 was heated to 125C, while the two optical materials used for collecting contaminants were maintained at 25C. The results show that UV-and AO-irradiation have impacted the optical properties of silicone contaminants, for example, some optical spectral peaks were disappeared by AO irradiation., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: DS1640237000},
 pages = {330408-1--330408-6},
 title = {Impact Assessment about UV- and AO-Irradiated Silicone Contaminants through Optical Property Measurement},
 volume = {33},
 year = {2016}
}