{"created":"2023-06-20T14:53:37.525951+00:00","id":21838,"links":{},"metadata":{"_buckets":{"deposit":"4765857b-a944-47f3-a749-c7c8b112d04b"},"_deposit":{"created_by":1,"id":"21838","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"21838"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00021838","sets":["1887:1888"]},"author_link":["204833","204834","204836","204835"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"3393","bibliographicPageStart":"3388","bibliographicVolumeNumber":"55","bibliographic_titles":[{},{"bibliographic_title":"IEEE Transactions on Nuclear Science","bibliographic_titleLang":"en"}]}]},"item_7_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: PA0810021000","subitem_description_type":"Other"}]},"item_7_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"The Institute of Electrical and Electronic Engineers(IEEE)"}]},"item_7_relation_25":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"info:doi/10.1109/TNS.2008.2007902"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/TNS.2008.2007902","subitem_relation_type_select":"DOI"}}]},"item_7_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9499","subitem_source_identifier_type":"ISSN"}]},"item_7_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構 (JAXA)"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ikeda, Naomi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuboyama, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Satoh, Yohei","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tamura, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Hevy ion","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"latent damage","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"power MOSFET","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Study of Latent Damage in Power MOSFETs Caused by Heavy Ion Irradiation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Study of Latent Damage in Power MOSFETs Caused by Heavy Ion Irradiation","subitem_title_language":"en"}]},"item_type_id":"7","owner":"1","path":["1888"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"21838","relation_version_is_last":true,"title":["Study of Latent Damage in Power MOSFETs Caused by Heavy Ion Irradiation"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T03:30:05.689624+00:00"}