{"created":"2023-06-20T14:53:40.221004+00:00","id":21897,"links":{},"metadata":{"_buckets":{"deposit":"58d1d0bd-23ae-4b5f-9aa3-65f153812caa"},"_deposit":{"created_by":1,"id":"21897","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"21897"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00021897","sets":["1887:1888"]},"author_link":["205114","205115","205116","205112","205117","205118","205113","205119"],"item_7_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"A theoretical study on measurement accuracy of the REV method for phased array measurement system designs"}]},"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"30","bibliographicPageEnd":"10","bibliographicPageStart":"5","bibliographicVolumeNumber":"108","bibliographic_titles":[{"bibliographic_title":"信学技報"},{"bibliographic_title":"IEICE Technical Report","bibliographic_titleLang":"en"}]}]},"item_7_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: PA0810083000","subitem_description_type":"Other"}]},"item_7_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_7_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"The Institute of Electronics, Information and Communication Engineers"}]},"item_7_relation_12":{"attribute_name":"関係URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://ci.nii.ac.jp/naid/110006863431"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ci.nii.ac.jp/naid/110006863431","subitem_relation_type_select":"URI"}}]},"item_7_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0913-5685","subitem_source_identifier_type":"ISSN"}]},"item_7_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10060764","subitem_source_identifier_type":"NCID"}]},"item_7_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"三菱電機株式会社"},{"subitem_text_value":"三菱電機株式会社"},{"subitem_text_value":"三菱電機株式会社"},{"subitem_text_value":"三菱電機株式会社"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Electric Corporation"},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Electric Corporation"},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Electric Corporation"},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Electric Corporation"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高橋, 徹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大塚, 昌孝"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐倉, 武志"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小西, 善彦"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahashi, Toru","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ohtsuka, Masataka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakura, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Konishi, Yoshihiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"フェーズドアレー","subitem_subject_scheme":"Other"},{"subitem_subject":"素子電界ベクトル回転法","subitem_subject_scheme":"Other"},{"subitem_subject":"回線設計","subitem_subject_scheme":"Other"},{"subitem_subject":"熱雑音","subitem_subject_scheme":"Other"},{"subitem_subject":"測定誤差","subitem_subject_scheme":"Other"},{"subitem_subject":"Phased array","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"REV method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Link budget","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Thermal noise","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Measurement error","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"フェーズドアレーアンテナ測定系回線設計と素子電界ベクトル回転法の測定誤差の理論検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"フェーズドアレーアンテナ測定系回線設計と素子電界ベクトル回転法の測定誤差の理論検討"}]},"item_type_id":"7","owner":"1","path":["1888"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"21897","relation_version_is_last":true,"title":["フェーズドアレーアンテナ測定系回線設計と素子電界ベクトル回転法の測定誤差の理論検討"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T03:29:15.126842+00:00"}