@techreport{oai:jaxa.repo.nii.ac.jp:00002219,
 author = {正木, 匡彦 and 石川, 毅彦 and Paradis, Paul-Francois and 依田, 眞一 and 岡田, 純平 and 渡辺, 康裕 and 七尾, 進 and 石蔵, 明子 and 樋口, 健介 and 水野, 章敏 and Masaki, Tadahiko and Ishikawa, Takehiko and Paradis, Paul-Francois and Yoda, Shinichi and Okada, Junpei T. and Watanabe, Yasuhiro and Nanao, Susumu and Ishikura, Akiko and Higuchi, Kensuke and Mizuno, Akitoshi},
 month = {Mar},
 note = {An electrostatic levitator was developed for the structural analysis of high-temperature and undercooled liquids by X-ray diffraction. The apparatus can be used to investigate the structure of metallic, semiconductor, and ceramic liquids. Samples of zirconium, silicon, and alumina in their liquid phases could be kept levitated for more than one hour with this apparatus. This was sufficiently long to perform a detailed analysis of the liquid structure by X-ray diffraction techniques., 資料番号: AA0063323003, レポート番号: JAXA-RR-06-015E},
 title = {Electrostatic levitation furnace for X-ray diffraction measurements of high-temperature liquid materials},
 year = {2007}
}