@article{oai:jaxa.repo.nii.ac.jp:00023187,
 author = {牧野, 高紘 and 小林, 大輔 and 廣瀬, 和之 and 柳川, 善光 and 齋藤, 宏文 and 池田, 博一 and 高橋, 大輔 and 石井, 茂 and 草野, 将樹 and 小野田, 忍 and 平尾, 敏雄 and 大島, 武 and Makino, T. and Kobayashi, Daisuke and Hirose, Kazuyuki and Yanagawa, Y. and Saito, Hirobumi and Ikeda, Hirokazu and Takahashi, D. and Ishii, S. and Kusano, M. and Onoda, S. and Hirao, T. and Ohshima, T.},
 issue = {1},
 journal = {IEEE Transactions on Nuclear Science},
 month = {},
 note = {資料番号: PAIS08147000},
 pages = {202--207},
 title = {LET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell},
 volume = {56},
 year = {2008}
}