@article{oai:jaxa.repo.nii.ac.jp:00023189,
 author = {柳川, 善光 and 小林, 大輔 and 池田, 博一 and 齋藤, 宏文 and 廣瀬, 和之 and Yanagawa, Y. and Kobayashi, Daisuke and Ikeda, Hirokazu and Saito, Hirobumi and Hirose, Kazuyuki},
 issue = {4},
 journal = {IEEE Transactions on Nuclear Science},
 month = {},
 note = {資料番号: PAIS08149000},
 pages = {1947--1952},
 title = {Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems},
 volume = {55},
 year = {2008}
}