@article{oai:jaxa.repo.nii.ac.jp:00023482,
 author = {Dodd, P. E.. and Schwank, J. R. and Shaneyfelt, M. R. and Felix, J. A. and Paillet, P. and Ferlet-Cavrois, V. and Baggio, J. and Reed, R. A. and Warren, K. M. and Weller, R. A. and Schrimpf, R. D. and Hash, G. L. and Dalton, S. M. and 廣瀬, 和之 and 齋藤, 宏文 and Dodd, P. E.. and Schwank, J. R. and Shaneyfelt, M. R. and Felix, J. A. and Paillet, P. and Ferlet-Cavrois, V. and Baggio, J. and Reed, R. A. and Warren, K. M. and Weller, R. A. and Schrimpf, R. D. and Hash, G. L. and Dalton, S. M. and Hirose, Kazuyuki and Saito, Hirobumi},
 issue = {6},
 journal = {IEEE Transactions on Nuclear Science},
 month = {},
 note = {著者人数：15名, 資料番号: SA1000140000},
 pages = {2303--2313},
 title = {Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits},
 volume = {54},
 year = {2007}
}