@article{oai:jaxa.repo.nii.ac.jp:00023580,
 author = {田島, 道夫 and Hoshino, Norihiro and Tajima, Michio and Nishiguchi, Taro and Ikeda, Keiichi and Hayashi, Toshihiko and Kinoshita, Hiroyuki and Shiomi, Hiromu},
 issue = {40},
 journal = {Japanese Journal of Applied Physics},
 month = {Oct},
 note = {Accepted: 2007-09-04, 資料番号: SA1000253000},
 pages = {L973--L975},
 title = {Nondestructive Analysis of Propagation of Stacking Faults in SiC Bulk Substrate and Epitaxial Layer by Photoluminescence Mapping},
 volume = {46},
 year = {2007}
}