@article{oai:jaxa.repo.nii.ac.jp:00023889,
 author = {杉本, 広紀 and 井上, 雅晶 and 田島, 道夫 and 小椋, 厚志 and 大下, 祥雄 and Sugimoto, Hiroki and Inoue, Masaaki and Tajima, Michio and Ogura, Atsushi and Ohshita, Yoshio},
 issue = {25},
 journal = {Japanese Journal of Applied Physics},
 month = {Jul},
 note = {資料番号: SA1000565000},
 pages = {Ｌ641--Ｌ643},
 title = {Analysis of Intra-Grain Defects in Multicrystalline Silicon Wafers by Photoluminescence Mapping and Spectroscopy},
 volume = {45},
 year = {2006}
}