{"created":"2023-06-20T14:56:25.906521+00:00","id":24997,"links":{},"metadata":{"_buckets":{"deposit":"ffda98d2-aab2-4e62-a4de-1b9d48eaad38"},"_deposit":{"created_by":1,"id":"24997","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"24997"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00024997","sets":["1887:1888"]},"author_link":["250996","250999","251000","250997","250998"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"162","bibliographicPageStart":"160","bibliographicVolumeNumber":"10","bibliographic_titles":[{},{"bibliographic_title":"Microwave and Optical Technology Letters","bibliographic_titleLang":"en"}]}]},"item_7_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA1001698000","subitem_description_type":"Other"}]},"item_7_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Wiley"}]},"item_7_relation_25":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"info:doi/10.1002/mop.4650100310"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1002/mop.4650100310","subitem_relation_type_select":"DOI"}}]},"item_7_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0895-2477","subitem_source_identifier_type":"ISSN"}]},"item_7_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10720362","subitem_source_identifier_type":"NCID"}]},"item_7_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"青山学院大学"},{"subitem_text_value":"青山学院大学"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electrical and Electronic Engineering, Aoyama Gakuin University"},{"subitem_text_language":"en","subitem_text_value":"Department of Electrical and Electronic Engineering, Aoyama Gakuin University"},{"subitem_text_language":"en","subitem_text_value":"Electromagnetic Communication Laboratory, University of Illinois"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"阿部, 琢美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"橋本, 修"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Abe, Takumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hashimoto, O.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mittra, Raj","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"FDTD analysis of permittivity measurement with rectangular cavity resonators","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"FDTD analysis of permittivity measurement with rectangular cavity resonators","subitem_title_language":"en"}]},"item_type_id":"7","owner":"1","path":["1888"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"24997","relation_version_is_last":true,"title":["FDTD analysis of permittivity measurement with rectangular cavity resonators"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T02:42:56.204924+00:00"}