@article{oai:jaxa.repo.nii.ac.jp:00025296,
 author = {萩本, 賢哉 and 藤岡, 洋 and 尾嶋, 正治 and 廣瀬, 和之 and Hagimoto, Y. and Fujioka, H. and Oshima, M. and Hirose, Kazuyuki},
 issue = {25},
 journal = {Applied Physics Letters},
 month = {Dec},
 note = {Accepted: 2000-10-25, 資料番号: SA1001998000},
 pages = {4175--4177},
 title = {Characterizing carrier-trapping phenomena in ultrathin SiO2 films by using the X-ray photoelectron spectroscopy time-dependent measurements},
 volume = {77},
 year = {2000}
}