@article{oai:jaxa.repo.nii.ac.jp:00025308,
 author = {廣瀬, 和之 and 川尻, 智司 and 服部, 健雄 and Hirose, Kazuyuki and Kawashiri, S. and Hattori, T.},
 issue = {1-4},
 journal = {Applied Surface Science},
 month = {Jul},
 note = {資料番号: SA1002010000},
 pages = {202--206},
 title = {XPS analysis of carrier trapping phenomena in ultrathin SiO2 film formed on Si substrate},
 volume = {234},
 year = {2004}
}