@article{oai:jaxa.repo.nii.ac.jp:00025316,
 author = {廣瀬, 和之 and 齋藤, 宏文 and Baggio, J. and Ferlet-Cavrois, V. and Lambert, D. and Paillet, P. and Wrobel, F. and Hirose, Kazuyuki and Saito, Hirobumi and Blackmore, E.W.},
 issue = {6},
 journal = {IEEE Transactions on Nuclear Science},
 month = {Dec},
 note = {資料番号: SA1002018000},
 pages = {2319--2325},
 title = {Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs},
 volume = {52},
 year = {2005}
}