@article{oai:jaxa.repo.nii.ac.jp:00025317,
 author = {廣瀬, 和之 and 齋藤, 宏文 and Dodd, P. E. and Schwank, J. R. and Shaneyfelt, M. R. and Ferlet-Cavrois, V. and Paillet, P. and Baggio, J. and Hash, G. L. and Felix, J. A. and Hirose, Kazuyuki and Saito, Hirobumi},
 issue = {4},
 journal = {IEEE Transactions on Nuclear Science},
 month = {Aug},
 note = {資料番号: SA1002019000},
 pages = {889--893},
 title = {Heavy Ion energy effects in CMOS SRAMs},
 volume = {54},
 year = {2007}
}