@article{oai:jaxa.repo.nii.ac.jp:00025998,
 author = {小林, 大輔 and Simoen, Eddy and Put, Sofie and Griffoni, Alessio and Poizat, Marc and 廣瀬, 和之 and Claeys, Cor and Kobayashi, Daisuke and Simoen, Eddy and Put, Sofie and Griffoni, Alessio and Poizat, Marc and Hirose, Kazuyuki and Claeys, Cor},
 issue = {3},
 journal = {IEEE Transactions on Nuclear Science},
 month = {Jun},
 note = {Accepted: 2011-01-24, 資料番号: SA1002700000},
 pages = {800--807},
 title = {Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates},
 volume = {58},
 year = {2011}
}