{"created":"2023-06-20T14:36:19.021832+00:00","id":2633,"links":{},"metadata":{"_buckets":{"deposit":"a984c21b-9bbd-48d7-9102-84b66ca19294"},"_deposit":{"created_by":1,"id":"2633","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"2633"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00002633","sets":["1887:1893","9:1090:1280:1289"]},"author_link":["7948","7939","7951","7945","7952","7954","7937","7956","7938","7942","7953","7955","7946","7950","7943","7949","7940","7944","7947","7941"],"item_3_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Moon surface simulated environmental test"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-03-30","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"JAXA-RM-06-008","bibliographic_titles":[{"bibliographic_title":"宇宙航空研究開発機構研究開発資料"},{"bibliographic_title":"JAXA Research and Development Memorandum","bibliographic_titleLang":"en"}]}]},"item_3_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"月の1日は地球の1日=24時間を単位とすると29.5日である。従って、月の昼は14.75日、夜は14.75日となり、月の赤道付近のレゴリスの温度は、昼は120度Cまで上昇し、夜は-180度C以下まで降下すると言われている。月面に軟着陸した探査機やローバが長期間その機能を維持するには、昼間の高温に耐えなければならないのは当然である。加えて、約15日間続く夜間を乗り越え、次の昼には活動を再開しなければならない。さて、現在我々が利用出来る機器は上記の厳しい温度環境に対し、どの程度の耐性を持っているのだろうか。高温側のデータは揃っていると言えるが、-180度Cという低温側のデータはほとんど無いというのが実情である。そこで、温度制御の出来る宇宙環境模擬装置を用いて、高真空の月面まで含めた月面環境試験を実施する事にした。","subitem_description_type":"Abstract"}]},"item_3_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"The surface environment of the moon is high vacuum and extreme temperature change. With a day of the earth as a unit, a day of the moon becomes 30 days, the daytime of 15 days and the night of 15 days. Temperature of regolith in the vicinity of equator rise up to 120 C in daytime, and descends down to -180 C at night. The tolerance of a present equipment is uncertain though the equipment set up in the surface of the moon should endure a severe above-mentioned environment. Then, typical various test pieces were collected, and it went twice in the environmental test with a space environment test equipment. It reports on the passage of the test and the evaluation of the result to here.","subitem_description_type":"Other"}]},"item_3_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: AA0063605000","subitem_description_type":"Other"}]},"item_3_description_33":{"attribute_name":"レポート番号","attribute_value_mlt":[{"subitem_description":"レポート番号: JAXA-RM-06-008","subitem_description_type":"Other"}]},"item_3_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宇宙航空研究開発機構"}]},"item_3_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Japan Aerospace Exploration Agency (JAXA)"}]},"item_3_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1349-1121","subitem_source_identifier_type":"ISSN"}]},"item_3_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11983593","subitem_source_identifier_type":"NCID"}]},"item_3_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"},{"subitem_text_value":"宇宙航空研究開発機構"}]},"item_3_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"},{"subitem_text_language":"en","subitem_text_value":"Japan Aerospace Exploration Agency"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"星野, 健"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 甲太郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"四宮, 康雄"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"片山, 保宏"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤原, 勉"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"若林, 幸子"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岡田, 達明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"久保田, 孝"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大槻, 真嗣"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岩田, 隆浩"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hoshino, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsumoto, Kotaro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinomiya, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Katayama, Yasuhiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujiwara, Tsutomu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wakabayashi, Sachiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Okada, Tatsuaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kubota, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Otsuki, Masatsugu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwata, Takahiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-15"}],"displaytype":"detail","filename":"63605000.pdf","filesize":[{"value":"21.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"63605000.pdf","url":"https://jaxa.repo.nii.ac.jp/record/2633/files/63605000.pdf"},"version_id":"732c19ff-930e-41ee-b43d-b5ee6ac88751"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"月探査","subitem_subject_scheme":"Other"},{"subitem_subject":"月面","subitem_subject_scheme":"Other"},{"subitem_subject":"月周回軌道","subitem_subject_scheme":"Other"},{"subitem_subject":"地上試験","subitem_subject_scheme":"Other"},{"subitem_subject":"平面鏡","subitem_subject_scheme":"Other"},{"subitem_subject":"CCDカメラ","subitem_subject_scheme":"Other"},{"subitem_subject":"結晶振動子","subitem_subject_scheme":"Other"},{"subitem_subject":"温度計測","subitem_subject_scheme":"Other"},{"subitem_subject":"高温試験","subitem_subject_scheme":"Other"},{"subitem_subject":"低温試験","subitem_subject_scheme":"Other"},{"subitem_subject":"極低温","subitem_subject_scheme":"Other"},{"subitem_subject":"超音波モータ","subitem_subject_scheme":"Other"},{"subitem_subject":"レンズ","subitem_subject_scheme":"Other"},{"subitem_subject":"lunar exploration","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"lunar surface","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"lunar orbit","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"ground test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"plane mirror","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"CCD camera","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"crystal oscillator","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"temperature measurement","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"high temperature test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"low temperature test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cryogenic temperature","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"ultrasonic motor","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"lens","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"technical 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