@article{oai:jaxa.repo.nii.ac.jp:00026630,
 author = {田島, 道夫 and 東, 栄光 and 林, 利彦 and 木下, 博之 and 塩見, 弘 and Tajima, Michio and Higashi, Eiko and Hayashi, T. and Kinoshita, H. and Shiomi, H.},
 issue = {6},
 journal = {Applied Physics Letters},
 month = {},
 note = {Accepted: 2004-12-11, 資料番号: SA1003332000},
 title = {Nondestructive characterization of dislocations and micropipes in high-resistivity 6H-SiC wafers by deep-level photoluminescence mapping},
 volume = {86},
 year = {2005}
}