@article{oai:jaxa.repo.nii.ac.jp:00026937,
 author = {関, 洋 and 渋谷, 寧浩 and 小林, 大輔 and 野平, 博司 and 泰岡, 顕治 and 廣瀬, 和之 and Seki, Hiroshi and Shibuya, Yasuhiro and Kobayashi, Daisuke and Nohira, Hiroshi and Yasuoka, Kenji and Hirose, Kazuyuki},
 issue = {4},
 journal = {Japanese Journal of Applied Physics},
 month = {Apr},
 note = {Accepted: 2011-12-02, 資料番号: SA1003639000},
 title = {Estimation of Breakdown Electric-Field Strength While Reflecting Local Structures of SiO2 Gate Dielectrics Using First-Principles Molecular Orbital Calculation Technique},
 volume = {51},
 year = {2012}
}