@techreport{oai:jaxa.repo.nii.ac.jp:00002766,
 author = {新藤, 浩之 and 池田, 直美 and 飯出, 芳弥 and 浅井, 弘彰 and 久保山, 智司 and 松田, 純夫 and Shindo, Hiroyuki and Ikeda, Naomi and Iide, Yoshiya and Asai, Hiroaki and Kuboyama, Satoshi and Matsuda, Sumio},
 month = {Feb},
 note = {This paper shows the analysis results of the Total Ionizing Dose (TID) Effects on COTS Memories by MDS-1 (Tsubasa) satellite. Seven types of commercial devices are installed and evaluated. The measurement result basically consists with the prediction from the ground test data in all devices. But, in DRAMs, the change of the electrical characteristic caused by TID effect surpasses the prediction. This result indicates that the criteria of the ground TID evaluation test should be carefully determined. These results will be reflected in the establishment of guideline for the ground test technique., 資料番号: AA0046975006, レポート番号: JAXA-RM-03-022},
 title = {MDS-1(つばさ)搭載民生用メモリ素子のトータルドーズ効果に関する解析結果},
 year = {2004}
}