{"created":"2023-06-20T15:00:16.123824+00:00","id":29197,"links":{},"metadata":{"_buckets":{"deposit":"b66a9440-27ea-423a-920f-40f024770642"},"_deposit":{"created_by":1,"id":"29197","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"29197"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00029197","sets":["1887:1888"]},"author_link":["361662","361650","361656","361651","361654","361657","361653","361647","361655","361649","361659","361660","361652","361658","361648","361661"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"1184","bibliographicPageStart":"1181","bibliographicVolumeNumber":"48","bibliographic_titles":[{},{"bibliographic_title":"Surface and Interface Analysis","bibliographic_titleLang":"en"}]}]},"item_7_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Accepted: 2016-07-19","subitem_description_type":"Other"}]},"item_7_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA1160174000","subitem_description_type":"Other"}]},"item_7_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Heyden & Son"}]},"item_7_relation_25":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"info:doi/10.1002/sia.6119"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1002/sia.6119","subitem_relation_type_select":"DOI"}}]},"item_7_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0142-2421","subitem_source_identifier_type":"ISSN"}]},"item_7_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00445749","subitem_source_identifier_type":"NCID"}]},"item_7_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"北海道大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS)"},{"subitem_text_value":"北海道大学"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"CMS/SESE, Arizona State University"},{"subitem_text_value":"日本電子株式会社"},{"subitem_text_value":"九州大学"},{"subitem_text_value":"大阪大学"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Natural History Sciences, Hokkaido University : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS)"},{"subitem_text_language":"en","subitem_text_value":"Department of Natural History Sciences, Hokkaido University"},{"subitem_text_language":"en","subitem_text_value":"National Institute for Materials Science"},{"subitem_text_language":"en","subitem_text_value":"National Institute for Materials Science"},{"subitem_text_language":"en","subitem_text_value":"CMS/SESE, Arizona State University"},{"subitem_text_language":"en","subitem_text_value":"JEOL Ltd."},{"subitem_text_language":"en","subitem_text_value":"Graduate School of Engineering Sciences, Kyushu University"},{"subitem_text_language":"en","subitem_text_value":"Department of Physics, Osaka University"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"圦本, 尚義"}],"nameIdentifiers":[{"nameIdentifier":"361647","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"馬上, 謙一"}],"nameIdentifiers":[{"nameIdentifier":"361648","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"坂口, 勲"}],"nameIdentifiers":[{"nameIdentifier":"361649","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Taku T."}],"nameIdentifiers":[{"nameIdentifier":"361650","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Jurewicz, Amy J. G."}],"nameIdentifiers":[{"nameIdentifier":"361651","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"糸瀬, 悟"}],"nameIdentifiers":[{"nameIdentifier":"361652","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内野, 喜一郎"}],"nameIdentifiers":[{"nameIdentifier":"361653","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石原, 盛男"}],"nameIdentifiers":[{"nameIdentifier":"361654","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yurimoto, Hisayoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361655","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Bajo, Ken-ichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361656","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sakaguchi, Isao","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361657","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Taku T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361658","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Jurewicz, Amy J. G.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361659","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Itose, Satoru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361660","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Uchino, Kiichiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361661","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ishihara, Morio","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"361662","nameIdentifierScheme":"WEKO"}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"tunnel-ionization","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"helium","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"post-ionization","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"femtosecond laser","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"mass spectrometry","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"quantitative analysis","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Quantitative analysis of helium by post-ionization method using femtosecond laser technique","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Quantitative analysis of helium by post-ionization method using femtosecond laser technique","subitem_title_language":"en"}]},"item_type_id":"7","owner":"1","path":["1888"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-01-26"},"publish_date":"2017-01-26","publish_status":"0","recid":"29197","relation_version_is_last":true,"title":["Quantitative analysis of helium by post-ionization method using femtosecond laser technique"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T01:38:22.414819+00:00"}