{"created":"2023-06-20T15:00:38.085017+00:00","id":29593,"links":{},"metadata":{"_buckets":{"deposit":"4353243a-4aae-45e4-b552-20dfcdba317c"},"_deposit":{"created_by":1,"id":"29593","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"29593"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00029593","sets":["1887:1888"]},"author_link":["372966","372955","372962","372957","372965","372963","372960","372968","372959","372975","372976","372964","372970","372954","372956","372974","372961","372971","372969","372958","372972","372967","372973","372977"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"532","bibliographicPageStart":"523","bibliographicVolumeNumber":"65","bibliographic_titles":[{},{"bibliographic_title":"IEEE Transactions on Nuclear Science","bibliographic_titleLang":"en"}]}]},"item_7_description_18":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"著者人数: 12名","subitem_description_type":"Other"}]},"item_7_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Accepted: 2017-11-14","subitem_description_type":"Other"}]},"item_7_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA1170193000","subitem_description_type":"Other"}]},"item_7_publisher_9":{"attribute_name":"出版者（英）","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers"}]},"item_7_relation_25":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"info:doi/10.1109/TNS.2017.2774805"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/TNS.2017.2774805","subitem_relation_type_select":"DOI"}}]},"item_7_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9499","subitem_source_identifier_type":"ISSN"}]},"item_7_source_id_22":{"attribute_name":"ISSNONLINE","attribute_value_mlt":[{"subitem_source_identifier":"1558-1578","subitem_source_identifier_type":"ISSN"}]},"item_7_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667999","subitem_source_identifier_type":"NCID"}]},"item_7_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学"},{"subitem_text_value":"宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS) : 東京大学"},{"subitem_text_value":"宇宙航空研究開発機構研究開発部門 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構研究開発部門 (JAXA)"},{"subitem_text_value":"宇宙航空研究開発機構研究開発部門 (JAXA)"},{"subitem_text_value":"量子科学技術研究開発機構"},{"subitem_text_value":"量子科学技術研究開発機構"},{"subitem_text_value":"三菱重工業株式会社"},{"subitem_text_value":"三菱重工業株式会社"},{"subitem_text_value":"三菱重工業株式会社"},{"subitem_text_value":"三菱重工業株式会社"},{"subitem_text_value":"三菱重工業株式会社"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo"},{"subitem_text_language":"en","subitem_text_value":"Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS) : Graduate School of Engineering, The University of Tokyo"},{"subitem_text_language":"en","subitem_text_value":"Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"Research and Development Directorate, Japan Aerospace Exploration Agency (JAXA)"},{"subitem_text_language":"en","subitem_text_value":"National Institutes for Quantum and Radiological Science and Technology"},{"subitem_text_language":"en","subitem_text_value":"National Institutes for Quantum and Radiological Science and Technology"},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Heavy Industries, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Heavy Industries, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Heavy Industries, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Heavy Industries, Ltd."},{"subitem_text_language":"en","subitem_text_value":"Mitsubishi Heavy Industries, Ltd."}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小林, 大輔"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"廣瀬, 和之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"伊藤, 大智"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"梯, 友哉"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"川崎, 治"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"牧野, 高紘"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大島, 武"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松浦, 大介"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"成田, 貴則"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"加藤, 昌浩"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"石井, 茂"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"益川, 一範"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kobayashi, Daisuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hirose, Kazuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ito, Taichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kakehashi, Yuya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawasaki, Osamu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makino, Takahiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ohshima, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuura, Daisuke","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Narita, Takanori","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato, Masahiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ishii, Shigeru","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masukawa, Kazunori","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Ion radiation effects","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"radiation hardening","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"semiconductor device reliability","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"silicon-on-insulator (SOI) technologies","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"single-event upsets","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"soft errors","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets","subitem_title_language":"en"}]},"item_type_id":"7","owner":"1","path":["1888"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-02-08"},"publish_date":"2018-02-08","publish_status":"0","recid":"29593","relation_version_is_last":true,"title":["Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T01:32:16.225701+00:00"}