@article{oai:jaxa.repo.nii.ac.jp:00029948,
 author = {Chung, Chin-Han and 小林, 大輔 and 廣瀬, 和之 and Chung, Chin-Han and Kobayashi, Daisuke and Hirose, Kazuyuki},
 issue = {4},
 journal = {IEEE Transactions on Device and materials Reliability},
 month = {Dec},
 note = {Accepted: 2018-09-24, 資料番号: SA1180171000},
 pages = {574--582},
 title = {Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation Under the BOX},
 volume = {18},
 year = {2018}
}