{"created":"2023-06-20T15:00:58.553366+00:00","id":29948,"links":{},"metadata":{"_buckets":{"deposit":"a8397b02-ccaa-43c7-ac89-13c75e201996"},"_deposit":{"created_by":1,"id":"29948","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"29948"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00029948","sets":["1887:1888"]},"author_link":["387992","387993","387991","387995","387994","387996"],"item_7_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"582","bibliographicPageStart":"574","bibliographicVolumeNumber":"18","bibliographic_titles":[{},{"bibliographic_title":"IEEE Transactions on Device and materials Reliability","bibliographic_titleLang":"en"}]}]},"item_7_description_19":{"attribute_name":"内容記述（英）","attribute_value_mlt":[{"subitem_description":"Accepted: 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宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS)"},{"subitem_text_value":"東京大学 : 宇宙航空研究開発機構宇宙科学研究所(JAXA)(ISAS)"}]},"item_7_text_7":{"attribute_name":"著者所属（英）","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS)"},{"subitem_text_language":"en","subitem_text_value":"Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency(JAXA)(ISAS)"},{"subitem_text_language":"en","subitem_text_value":"Department of Electrical Engineering and Informative System, Graduate School of Engineering, University of Tokyo : Institute of Space and Astronautical Science, Japan Aerospace Exploration 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