{"created":"2023-06-20T15:02:53.894570+00:00","id":31986,"links":{},"metadata":{"_buckets":{"deposit":"2596851b-9e4e-4b2a-ae52-4ca34e0686aa"},"_deposit":{"created_by":1,"id":"31986","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"31986"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00031986","sets":["1887:1890","1896:1898:1899:1910"]},"author_link":["406891","406889","406888","406890"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル(英)","attribute_value_mlt":[{"subitem_alternative_title":"Ionosheric Measuring Probe"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1968-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"236","bibliographicPageStart":"226","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"東京大学宇宙航空研究所報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"従来電離層プラズマ諸量の測定はおのおの別々の電極を用いて行なわれてきたが,プラズマ諸量の精密な相互比較をする場合とか,複数の種類のイオンが存在する場合などにおいては単一電極系を用いて同時測定を行なう必要がある.この論文では球形トラップ方式の電極で電離層プラズマ諸量を同時にかつself-consistentに測定する方法を考察した.","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Basic ionospheric parameters such as the electron density, the electron temperature, the ion density, the ion temperature, mixing ratio and etc., have been measured by individual probe systems with sounding rockets and satellites till now. However, it is preferable that all the ionospheric parameters are measured at the same time by a single probe assembly especially in the case of exact comparison between the parameters or in the case of the measurement of ionosphere where many kinds of ions exist simultaneously. In this paper, the method by which the electron density, the electron temperature, the ion density, the ion composition, the ion temperature and the plasma space potential relative to the vehicle potential are measured by means of spherical probe assembly is described. That is, this measuring method is suggested in order ot obtain all the ionospheric parameters self-consistently and accurately.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0125067000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学宇宙航空研究所"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0563-8100","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00161914","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"郵政省電波研究所"},{"subitem_text_value":"郵政省電波研究所"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮崎, 茂"}],"nameIdentifiers":[{"nameIdentifier":"406888","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"森, 弘隆"}],"nameIdentifiers":[{"nameIdentifier":"406889","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"MIYAZAKI, Shigeru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"406890","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"MORI, Hirotaka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"406891","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0125067.pdf","filesize":[{"value":"421.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0125067.pdf","url":"https://jaxa.repo.nii.ac.jp/record/31986/files/SA0125067.pdf"},"version_id":"e5739d76-a7ec-40a3-9d79-ac4bd87de1c5"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"電離層測定プローブ(II) : 球形Retarding Potential Trap","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電離層測定プローブ(II) : 球形Retarding Potential Trap"}]},"item_type_id":"9","owner":"1","path":["1890","1910"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"31986","relation_version_is_last":true,"title":["電離層測定プローブ(II) : 球形Retarding Potential Trap"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:44:30.034355+00:00"}