{"created":"2023-06-20T15:02:56.892203+00:00","id":32032,"links":{},"metadata":{"_buckets":{"deposit":"9fd145b6-9d9d-4065-a8b4-9aa0b9506799"},"_deposit":{"created_by":1,"id":"32032","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"32032"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00032032","sets":["1887:1890","1896:1898:1899:1910"]},"author_link":["407041","407043","407040","407042"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Ionospheric Measuring Probe (III)"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1968-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3_A","bibliographicPageEnd":"375","bibliographicPageStart":"368","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"東京大学宇宙航空研究所報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"従来,電離層プラズマ諸量の測定はおのおの別々の電極を用いて行なわれてきたが,プラズマ諸量の精密な相互比較をする場合とか,複数の種類のイオンが混在する場合などにおいては,単一電極系を用いて同時測定を行なう必要がある.この論文では,円筒形トラップ方式の電極で電離層プラズマ諸量を同時にかつself-consistentに測定する方法を考察した.","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"Basic ionospheric parameters such as electron density, electron temperature, ion density, ion temperature, space potential, etc., have till now been measured by individual probe system in use with the space vehicles. However, it is necessary to measure all the ionospheric parameters at the same time by a single probe assembly especially for detailed comparison between the parameters or for measurement of the ion density when there are many ion species in the ionosphere. This paper describes the method of measuring the electron density, electron temperature, plasma space potential relative to vehicle potential, ion composition, and ion temperature at the same time by the use of Faraday cap type probe assembly. This method of measurement is considered for the purpose of obtaining all the ionospheric parameters self-consistently and accurately.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0125122000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学宇宙航空研究所"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0563-8100","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00161914","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"郵政省電波研究所"},{"subitem_text_value":"郵政省電波研究所"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮崎, 茂"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"森, 弘隆"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MIYAZAKI, Shigeru","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MORI, Hirotaka","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0125122.pdf","filesize":[{"value":"403.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0125122.pdf","url":"https://jaxa.repo.nii.ac.jp/record/32032/files/SA0125122.pdf"},"version_id":"e855310e-c4df-4714-a35b-5cdce151456a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"電離層測定プローブ(III) : 円筒形Retarding Potential Trap","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電離層測定プローブ(III) : 円筒形Retarding Potential Trap"}]},"item_type_id":"9","owner":"1","path":["1890","1910"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"32032","relation_version_is_last":true,"title":["電離層測定プローブ(III) : 円筒形Retarding Potential Trap"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:43:06.118160+00:00"}