{"created":"2023-06-20T15:03:00.872747+00:00","id":32108,"links":{},"metadata":{"_buckets":{"deposit":"caba411e-c7ed-4009-84cb-67ed8b39f4a1"},"_deposit":{"created_by":1,"id":"32108","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"32108"},"status":"published"},"_oai":{"id":"oai:jaxa.repo.nii.ac.jp:00032108","sets":["1887:1890","1896:1898:1899:1910"]},"author_link":["407340","407337","407339","407338"],"item_9_alternative_title_2":{"attribute_name":"その他のタイトル（英）","attribute_value_mlt":[{"subitem_alternative_title":"Real Time Plasma Potential Meter"}]},"item_9_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1973-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2_B","bibliographicPageEnd":"450","bibliographicPageStart":"446","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"東京大学宇宙航空研究所報告"}]}]},"item_9_description_16":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"著者らは,プラズマ中の空間電位を直接に精度良くしかも実時間で測定することを目的とした空間電位計を開発したので紹介する.本測定器はツインプローブ法をもちいて,交流変調法により傾きの符号が変わる電圧V_sこプローブ電圧V_pをロックすることにより動作する.動作原理および測定の応用例を示した.","subitem_description_type":"Abstract"}]},"item_9_description_17":{"attribute_name":"抄録（英）","attribute_value_mlt":[{"subitem_description":"We introduced the instruments which can measure directly the space potential (spacial plasma potential) in the gas plasma at real time with high accuracy and responsibility for the spacial distribution and time variation of the plasma potential. This is on the basis of the density variation of the charged particles around the probe, which vary with vary with the probe potential, and density has maximum value when the probe potential equal to the space potential of its point of the plasma. AC voltage is superposed on the DC voltage biased probe, during DC voltage is smaller than the space potential (V_s), the variation of the charged particle densities modulated by AC voltage, doesn't change the phase against the reference AC voltage component of the probe (increasing process of the density), but when probe poential (V_p) larger than V_s, it changes the phase at 180 degree (decreasing process). Then we put the DC biased small lod type probe (for which gives the electron or ion densities around the probe) which closed to the main probe superposed the AC voltage (arbitrary configuration). By such modulated AC current component of its collected current, we use phase detecter and its output signal, DC bias voltage of the main probe is controled always fixed at V_p equal to V_s.","subitem_description_type":"Other"}]},"item_9_description_32":{"attribute_name":"資料番号","attribute_value_mlt":[{"subitem_description":"資料番号: SA0125220000","subitem_description_type":"Other"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学宇宙航空研究所"}]},"item_9_source_id_21":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0563-8100","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_24":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00161914","subitem_source_identifier_type":"NCID"}]},"item_9_text_6":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪市立大学工学部"},{"subitem_text_value":"大阪市立大学工学部"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"竹屋, 芳夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"南, 繁行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"TAKEYA, Yoshio","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"MINAMI, Shigeyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-01-24"}],"displaytype":"detail","filename":"SA0125220.pdf","filesize":[{"value":"311.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SA0125220.pdf","url":"https://jaxa.repo.nii.ac.jp/record/32108/files/SA0125220.pdf"},"version_id":"ae6a0fed-0981-4c59-8561-d276b6a1bd0e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"実時間形プラズマ電位計","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"実時間形プラズマ電位計"}]},"item_type_id":"9","owner":"1","path":["1890","1910"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-26"},"publish_date":"2015-03-26","publish_status":"0","recid":"32108","relation_version_is_last":true,"title":["実時間形プラズマ電位計"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-06-21T00:40:49.901041+00:00"}